Instituto de energía solar

1. Photoreflectance

• • Specifications according to ISO9001 (I-18-05)
  • Type of materials: Semiconductors
  • Metallization: NO
  • Thickness: <10mm
  • Size <0.5cmx0.5cm
  • Range of measurement: 400nm-2500nm

2. Quantum efficiency

• • Specifications according to ISO9001 (I-18-05)
  • Type of materials : 2 terminal Semiconductor Devices
  • Metallization: YES (grid)
  • Thickness: <5mm
  • Size <4cmx4cm
  • Range of measurement: 400nm-1700nm
  • Low Temperature Measurement Optional (see below)

3. Current-Voltage Characteristics

• • Specifications according to ISO9001 I-18-05
  • Type of materials : 2 terminal Semiconductor Devices
  • Metallization: YES
  • Thickness: <5mm
  • Size <1cmx1cm
  • Range of measurement: 100nA-1A
  • Low Temperature Measurement Optional (see below)

4. Concentration Measurements

• • Specifications according to ISO9001 I-18-05
  • Type of materials : 2 terminal Semiconductor Devices
  • Metallization: YES
  • Thickness: <5mm
  • Size <1cmx1cm
  • Range of measurement: 1uA-6A & 10ºC-50ºC
  • Low Temperature Measurement Optional (see below)

5. FTIR

• • Specifications according to ISO9001 I-18-05
  • Type of materials: semiconductors
  • Metallization: NO
  • Thickness: <5mm
  • Size >1cmx1cm
  • Range of measurement: 800nm-20000nm

6. Deep level Transient Spectroscopy (DLTS)

• • Specifications according to ISO9001 I-18-05
  • Type of materials: 2 terminal Semiconductor Devices
  • Metallization: YES
  • Thickness: <5mm
  • Size <1cm Ø
  • Range of measurement: 77K-330K

7. Photoluminiscence

• • Specifications according to ISO9001 I-18-05
  • Type of materials: semiconductors
  • Metallization: NO
  • Thickness: <5mm
  • Size >0.5cmx0.5cm
  • Range of measurement: 300nm-2000nm

8. Electroluminiscence

• • Specifications according to ISO9001 I-18-05
  • Type of materials: 2 terminal semiconductor Devices
  • Metallization: YES
  • Thickness: <5mm
  • Size < 0.5cmx0.5cm
  • Range of measurement: 300nm-2000nm

9. Profiler

• • Specifications according to ISO9001 I-18-05
  • Type of materials: non viscous materials
  • Metallization:--
  • Thickness: <30mm
  • Size <10cm Ø
  • Range of measurement: 1 Å-1.2 µm

10. Low Temperature Measurements

• • Our cryostats are able to be adapted to quantum efficiency, concentration and current-voltage measurements in order to test devices at low temperatures.
  • Specifications according to ISO9001 I-18-05
  • Type of materials: 2 terminal Semiconductor Devices
  • Metallization: YES
  • Thickness: <5mm
  • Size <1cm Ø
  • Range of measurement: 6K-298K